High-resolution x-ray scattering measurements: I. Surfaces

被引:78
作者
Daillant, J
Alba, M
机构
[1] Ctr Univ Paris Sud, LURE, F-91898 Orsay, France
[2] CEA Saclay, Serv Phys Etat Condense, F-91191 Gif Sur Yvette, France
关键词
D O I
10.1088/0034-4885/63/10/203
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
X-ray scattering investigations of surfaces and interfaces in soft-condensed matter are reviewed. Both high-resolution structural determinations in the direct space and investigations of fluctuations with long-range correlations requiring a high resolution in the Fourier space are discussed. All the scattering cross-sections for diffraction or diffuse scattering are derived within a unified frame, and the experimental aspects related to their measurement are discussed in detail. The general principles are illustrated by various examples of studies of the liquid-vapour interface, Langmuir and Langmuir-Blodgett films, wetting films, polymer films, liquid crystals and liquid-liquid interfaces.
引用
收藏
页码:1725 / 1777
页数:53
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