Magnetoresistance study of Co/Cu/NiFe/Cu multilayers prepared on V-groove substrates

Using multilayers prepared on the substrates with V-groove microstructures, we have measured the magnetoresistance (MR) both with CLP geometry and with current-at-an-angle-to-plane (CAP) geometry for the same sample. It was confirmed that CAP-MR is larger than CLP-MR. We estimated the CPP-MR (current-perpendicular-to-plane-magnetoresistance) value by extrapolation using observed CIP-MR and CAP-MR values. The deduced CPP data were analyzed by the series resistor model and the obtained parameters were compared with the results found by other experimental methods. The temperature dependence is discussed by the Fert-Campbell model and the spin-mixing resistivity is concluded to be much larger at the interface than in the magnetic layer.