X-ray spectrometry using polycapillary X-ray optics and position sensitive detector

被引:18
作者
Ding, XL [1 ]
Xie, JD [1 ]
He, YJ [1 ]
Pan, QL [1 ]
Yan, YM [1 ]
机构
[1] Beijing Normal Univ, Inst Low Energy Nucl Phys, Beijing Radiat Ctr, Beijing 100875, Peoples R China
关键词
X-ray; polycapillary X-ray optics; MXRF; position sensitive X-ray spectrometry;
D O I
10.1016/S0039-9140(00)00387-8
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
Polycapillary X-ray optics (capillary X-ray lens) are now popular in X-ray fluorescence (XRF) analysis. Such an X-ray lens can collect X-rays emitted from an X-ray source in a large solid angle and form a very intense X-ray microbeam which is very convenient for microbeam X-ray fluorescence (MXRF) analysis giving low minimum detection limits (MDLs) in energy dispersive X-ray fluorescence (EDXRF). A new method called position sensitive X-ray spectrometry (PSXS) which combines an X-ray lens used to form an intense XRF source and a position sensitive detector (PSD) used for wavelength dispersive spectrometry (WDS) measurement was developed recently in the X-ray Optics Laboratory of Institute of Low Energy Nuclear Physics (ILENP) at Beijing Normal University. Such a method can give high energy and spacial resolution and high detection efficiency simultaneously. A short view of development of both the EDXRF using a capillary X-ray lens and the new PSXS is given in this paper. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:17 / 22
页数:6
相关论文
共 13 条
[1]  
BUDNAR M, 1996, INT J PIXE, V6, P51
[2]  
DING X, 1999, ADV XRAY ANAL V41 DC
[3]  
DING XL, 1995, J BEIJING NORMAL U S, V31, P75
[4]   HIGH-RESOLUTION ION-INDUCED X-RAY SPECTROSCOPY FOR CHEMICAL-STATE ANALYSIS [J].
FOLKMANN, F .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 75 (1-4) :9-13
[5]   BROAD RANGE X-RAY CRYSTAL SPECTROMETER [J].
HITACHI, A ;
KUMAGAI, H ;
AWAYA, Y .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 195 (03) :631-634
[6]   GRAZING-INCIDENCE X-RAY-FLUORESCENCE ANALYSIS [J].
IIDA, A ;
SAKURAI, K ;
YOSHINAGA, A ;
GOHSHI, Y .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1986, 246 (1-3) :736-738
[7]   MULTIPLE REFLECTION FROM SURFACE X-RAY OPTICS [J].
KUMAKHOV, MA ;
KOMAROV, FF .
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1990, 191 (05) :289-350
[8]  
MEADA K, 1996, INT J PIXE, V6, P117
[9]  
Xie JD, 1999, J ANAL ATOM SPECTROM, V14, P391
[10]  
YAN Y, 1998, ADV XRAY ANAL V40 CD