GRAZING-INCIDENCE X-RAY-FLUORESCENCE ANALYSIS

[1] X-RAY EVANESCENT-WAVE ABSORPTION AND EMISSION [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (03) : 153 - 156

[2] CONCENTRATION PROFILE OF A DISSOLVED POLYMER NEAR THE AIR-LIQUID INTERFACE - X-RAY-FLUORESCENCE STUDY [J]. PHYSICAL REVIEW LETTERS, 1985, 54 (10) : 1039 - 1042

[3] EXPERIMENTAL COMPARISON OF SYNCHROTRON RADIATION WITH OTHER MODES OF EXCITATION OF X-RAYS FOR TRACE-ELEMENT ANALYSIS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 3 (1-3) : 232 - 240

[4] SYNCHROTRON RADIATION X-RAY-FLUORESCENCE ANALYSIS [J]. ANALYTICAL CHEMISTRY, 1983, 55 (02) : 187 - 190

[5] SENSITIVITY CALCULATIONS FOR MULTIELEMENTAL TRACE ANALYSIS BY SYNCHROTRON RADIATION-INDUCED X-RAY-FLUORESCENCE [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 204 (01): : 223 - 229

[6] SYNCHROTRON RADIATION EXCITED X-RAY-FLUORESCENCE ANALYSIS USING WIDE BAND PASS MONOCHROMATORS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1985, 235 (03) : 597 - 602

[7] IIDA A, UNPUB ANAL CHEM

[8] APPLICATION OF SYNCHROTRON RADIATION TO ELEMENTAL ANALYSIS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 3 (1-3) : 225 - 231

[9] KNOECHEL A, 1983, NUCL INSTRUM METHODS, V208, P659

[10] X-RAY TOTAL-EXTERNAL-REFLECTION-BRAGG DIFFRACTION - STRUCTURAL STUDY OF THE GAAS-AL INTERFACE [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (11) : 6927 - 6933

[1] X-RAY EVANESCENT-WAVE ABSORPTION AND EMISSION [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (03) : 153 - 156

[2] CONCENTRATION PROFILE OF A DISSOLVED POLYMER NEAR THE AIR-LIQUID INTERFACE - X-RAY-FLUORESCENCE STUDY [J]. PHYSICAL REVIEW LETTERS, 1985, 54 (10) : 1039 - 1042

[3] EXPERIMENTAL COMPARISON OF SYNCHROTRON RADIATION WITH OTHER MODES OF EXCITATION OF X-RAYS FOR TRACE-ELEMENT ANALYSIS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 3 (1-3) : 232 - 240

[4] SYNCHROTRON RADIATION X-RAY-FLUORESCENCE ANALYSIS [J]. ANALYTICAL CHEMISTRY, 1983, 55 (02) : 187 - 190

[5] SENSITIVITY CALCULATIONS FOR MULTIELEMENTAL TRACE ANALYSIS BY SYNCHROTRON RADIATION-INDUCED X-RAY-FLUORESCENCE [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1982, 204 (01): : 223 - 229

[6] SYNCHROTRON RADIATION EXCITED X-RAY-FLUORESCENCE ANALYSIS USING WIDE BAND PASS MONOCHROMATORS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1985, 235 (03) : 597 - 602

[7] IIDA A, UNPUB ANAL CHEM

[8] APPLICATION OF SYNCHROTRON RADIATION TO ELEMENTAL ANALYSIS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 3 (1-3) : 225 - 231

[9] KNOECHEL A, 1983, NUCL INSTRUM METHODS, V208, P659

[10] X-RAY TOTAL-EXTERNAL-REFLECTION-BRAGG DIFFRACTION - STRUCTURAL STUDY OF THE GAAS-AL INTERFACE [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (11) : 6927 - 6933