SENSITIVITY CALCULATIONS FOR MULTIELEMENTAL TRACE ANALYSIS BY SYNCHROTRON RADIATION-INDUCED X-RAY-FLUORESCENCE

被引：50

作者：

GORDON, BM

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1982年 / 204卷 / 01期

关键词：

Compendex;

D O I：

10.1016/0167-5087(82)90100-4

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

SPECTROMETERS, X-RAY

引用

页码：223 / 229

页数：7

共 18 条

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