Light emission induced by a scanning tunnel microscope from a doubly layered substrate

被引：10

作者：

Amemiya, K ^{[1
]}

机构：

[1] Natl Inst Mat Sci, Tsukuba, Ibaraki 3050047, Japan

来源：

PHYSICAL REVIEW B | 2003年 / 67卷 / 07期

关键词：

D O I：

10.1103/PhysRevB.67.075409

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Photon emission induced by a scanning tunneling microscope is studied theoretically when a substrate is covered with a layer of finite thickness. We formulate the calculation method of the radiated power including the retardation effect. Calculation of a metal film on a dielectric substrate indicates that the optimal thickness for the effective photon emission exists for the silver film. The effect of a dielectric film on a metal substrate is also investigated and it is found that the radiated power from the STM is enhanced strongly by putting the dielectric layer on the substrate.

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页数：6

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