X-ray analysis and computer simulation for grain size determination in nanostructured materials

被引：10

作者：

Alexandrov, IV

Enikeev, NA

机构：

[1] Ufa State Aviat Tech Univ, Inst Phys Adv Mat, Ufa 450000, Russia

[2] RAS, Inst Phys Mol & Crystals, Ufa 450065, Russia

来源：

MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2000年 / 286卷 / 01期

关键词：

nanostructured materials; severe plastic deformation; x-ray analysis;

D O I：

10.1016/S0921-5093(00)00652-3

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The problems of detailed X-ray characterization of pure nanostructured materials subjected to severe plastic deformation, namely large plastic deformation under applied high pressure without decomposition of a sample, are considered. Computer simulation has been used to interpret obtained experimental results. An analysis of applicability of various X-ray methods for determination of grain size in nanostructured materials has been carried out. Possible dislocation configurations responsible for specific defect structure formation due to severe plastic deformation have been determined. (C) 2000 Elsevier Science S.A. All rights reserved.

引用

页码：110 / 114

页数：5

共 14 条

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Warren BE, 1990, XRAY DIFFRACTION, P251

[12] X-RAY LINE BROADENING FROM FILED ALUMINIUM AND WOLFRAM [J].