Nanoscale polymer recognition by spectral signature in scattering infrared near-field microscopy

被引:175
作者
Taubner, T [1 ]
Hillenbrand, R
Keilmann, F
机构
[1] Max Planck Inst Biochem, Abt Mol Strukturbiol, D-82152 Munich, Germany
[2] Ctr NanoSci, D-82152 Munich, Germany
[3] Max Planck Inst Biochem, Nano Photon Grp, D-82152 Munich, Germany
关键词
D O I
10.1063/1.1827334
中图分类号
O59 [应用物理学];
学科分类号
摘要
We demonstrate-for a typical polymer vibrational infrared line-that scattering-type "apertureless" optical near-field microscopy features a spectral signature that differs characteristically from far-field absorption. Theory predicts a dispersion-like amplitude spectrum (besides an absorption-like, bell-shaped phase spectrum). This signature is experimentally verified for a vibrational resonance of PMMA, by probing with a CO laser tuned from 5.5 to 6 mum. We apply this signature to identify PMMA in the near-field imaging of a nanostructured PMMA/PS polymer blend, at <70 nm resolution. Our results suggest a potentially quantitative chemometry based on near-field infrared vibrational fingerprints with spatial resolution that could reach 10 nm. (C) 2004 American Institute of Physics.
引用
收藏
页码:5064 / 5066
页数:3
相关论文
共 22 条
[1]   Monolayer-sensitive infrared imaging of DNA stripes using apertureless near-field microscopy [J].
Akhremitchev, BB ;
Sun, YJ ;
Stebounova, L ;
Walker, GC .
LANGMUIR, 2002, 18 (14) :5325-5328
[2]   Apertureless scanning near-field infrared microscopy of a rough polymeric surface [J].
Akhremitchev, BB ;
Pollack, S ;
Walker, GC .
LANGMUIR, 2001, 17 (09) :2774-2781
[3]   THE EFFECTS OF THE INTERACTION BETWEEN RESONANCES IN THE ELECTROMAGNETIC RESPONSE OF A SPHERE-PLANE STRUCTURE - APPLICATIONS TO SURFACE ENHANCED SPECTROSCOPY [J].
ARAVIND, PK ;
METIU, H .
SURFACE SCIENCE, 1983, 124 (2-3) :506-528
[4]   Contrast and scattering efficiency of scattering-type near-field optical probes [J].
Haefliger, D ;
Plitzko, JM ;
Hillenbrand, R .
APPLIED PHYSICS LETTERS, 2004, 85 (19) :4466-4468
[5]   Scanning near-field optical microscopy with aperture probes: Fundamentals and applications [J].
Hecht, B ;
Sick, B ;
Wild, UP ;
Deckert, V ;
Zenobi, R ;
Martin, OJF ;
Pohl, DW .
JOURNAL OF CHEMICAL PHYSICS, 2000, 112 (18) :7761-7774
[6]   Complex optical constants on a subwavelength scale [J].
Hillenbrand, R ;
Keilmann, F .
PHYSICAL REVIEW LETTERS, 2000, 85 (14) :3029-3032
[7]   Material-specific mapping of metal/semiconductor/dielectric nanosystems at 10 nm resolution by backscattering near-field optical microscopy [J].
Hillenbrand, R ;
Keilmann, F .
APPLIED PHYSICS LETTERS, 2002, 80 (01) :25-27
[8]   Phonon-enhanced light-matter interaction at the nanometre scale [J].
Hillenbrand, R ;
Taubner, T ;
Keilmann, F .
NATURE, 2002, 418 (6894) :159-162
[9]   Time-domain mid-infrared frequency-comb spectrometer [J].
Keilmann, F ;
Gohle, C ;
Holzwarth, R .
OPTICS LETTERS, 2004, 29 (13) :1542-1544
[10]   Near-field microscopy by elastic light scattering from a tip [J].
Keilmann, F ;
Hillenbrand, R .
PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2004, 362 (1817) :787-805