ZrB2 substrate for nitride semiconductors

被引:22
作者
Kinoshita, H
Otani, S
Kamiyama, S
Amano, H
Akasaki, I
Suda, J
Matsunami, H
机构
[1] Kyocera Corp, Youkaichi Plant, Shiga 5278555, Japan
[2] Kyoto Univ, Dept Elect Sci & Engn, Sakyo Ku, Kyoto 6068501, Japan
[3] Meijo Univ, High Tech Res Ctr, Fac Sci & Tech, Tempaku Ku, Nagoya, Aichi 4688502, Japan
[4] Natl Inst Mat Sci, Adv Mat Lab, Tsukuba, Ibaraki 3050044, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2003年 / 42卷 / 4B期
关键词
GaN; lattice-matched substrate; ZrB2; floating zone; cleavage;
D O I
10.1143/JJAP.42.2260
中图分类号
O59 [应用物理学];
学科分类号
摘要
Zirconium diboride (ZrB2) has excellent properties as an electrically conductive substrate for nitride semiconductors. In this paper, the bulk growth of ZrB2 by a floating-zone method and some properties of ZrB2, together with a brief summary of heteroepitaxial growth of gallium nitride (GaN) by molecular beam epitaxy (MBE) and metalorganic vapor phase epitaxy (MOVPE), are presented. By optimizing the bulk growth conditions, a 20-mm-diameter ZrB2 single crystal was obtained. The cleavage direction of the ZrB2 (0001) substrate was confirmed to be parallel to [1 1(2) over bar 0], which is parallel to that of GaN (0001). Epitaxial growth by both MBE and MOVPE was demonstrated. The grown n-type GaN/ZrB2 structure exhibited ohmic-like current-voltage behavior. These results indicate that ZrB2 has potential for application to the substrate for nitride semiconductors.
引用
收藏
页码:2260 / 2264
页数:5
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