Risk assessment for heavy ions of parts tested with protons

被引：59

作者：

O'Neill, PM ^{[1
]}

Badhwar, GD ^{[1
]}

Culpepper, WX ^{[1
]}

机构：

[1] NASA, Lyndon B Johnson Space Ctr, Houston, TX 77058 USA

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1997年 / 44卷 / 06期

关键词：

D O I：

10.1109/23.659052

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An internuclear cascade - evaporation code is used to model energy deposition in thin slabs of silicon. This model shows that protons produce a significant number of events with effective Linear Energy Transfer (LET) greater than 8 MeV cm(2)/mg and demonstrates that proton testing of microelectronic components can be an effective way to screen devices for low earth orbit susceptibility to heavy ions.

引用

页码：2311 / 2314

页数：4

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