THE RELATIONSHIP OF PROTON AND HEAVY-ION UPSET THRESHOLDS

被引：43

作者：

PETERSEN, EL

机构：

[1] Naval Research Laboratory, Washington

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1992年 / 39卷 / 06期

关键词：

D O I：

10.1109/23.211341

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper presents a method of obtaining proton upset thresholds from heavy ion upset thresholds, and vice versa. This approach allows upset rates in either environment to be estimated using data from either environment. Devices with LET thresholds above 10 MeV/mg/cm2 may have unnaceptable proton induced upset rates in the proton radiation belt.

引用

收藏

页码：1600 / 1604

页数：5

相关论文

共 22 条

[1] PROTON UPSETS IN ORBIT [J].

BENDEL, WL ;

PETERSEN, EL .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4481-4485

[2] PREDICTING SINGLE EVENT UPSETS IN THE EARTHS PROTON BELTS [J].

BENDEL, WL ;

PETERSEN, EL .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1984, 31 (06) :1201-1206

[3] A MODEL FOR PROTON-INDUCED SEU [J].

BION, T ;

BOURRIEAU, J .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1989, 36 (06) :2281-2286

[4] CORRELATED PROTON AND HEAVY-ION UPSET MEASUREMENTS ON IDT STATIC RAMS [J].

CAMPBELL, AB ;

STAPOR, WJ ;

KOGA, R ;

KOLASINSKI, WA .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) :4150-4154

[5] CHARGE-DEPOSITION SPECTRA IN THIN SLABS OF SILICON INDUCED BY ENERGETIC PROTONS [J].

ELTELEATY, S ;

FARRELL, GE ;

MCNULTY, PJ .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4394-4397

[6] MICRODOSIMETRIC ANALYSIS OF PROTON-INDUCED REACTIONS IN SILICON AND GALLIUM-ARSENIDE [J].

FARRELL, GE ;

MCNULTY, PJ ;

ABDELKADER, W .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1984, 31 (06) :1073-1077

[7] MICRODOSIMETRIC ASPECTS OF PROTON-INDUCED NUCLEAR-REACTIONS IN THIN-LAYERS OF SILICON [J].

FARRELL, GE ;

MCNULTY, PJ .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1982, 29 (06) :2012-2016

[8] THE BEHAVIOR OF MEASURED SEU AT LOW ALTITUDE DURING PERIODS OF HIGH SOLAR-ACTIVITY [J].

HARBOESORENSEN, R ;

DALY, EJ ;

UNDERWOOD, CI ;

WARD, J ;

ADAMS, L .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1990, 37 (06) :1938-1946

[9] SEU TEST TECHNIQUES FOR 256K STATIC RAMS AND COMPARISONS OF UPSETS INDUCED BY HEAVY-IONS AND PROTONS [J].

KOGA, R ;

KOLASINSKI, WA ;

OSBORN, JV ;

ELDER, JH ;

CHITTY, R .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1988, 35 (06) :1638-1643

[10] TECHNIQUES OF MICROPROCESSOR TESTING AND SEU-RATE PREDICTION [J].

KOGA, R ;

KOLASINSKI, WA ;

MARRA, MT ;

HANNA, WA .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1985, 32 (06) :4219-4224