TECHNIQUES OF MICROPROCESSOR TESTING AND SEU-RATE PREDICTION

被引：47

作者：

KOGA, R ^{[1
]}

KOLASINSKI, WA ^{[1
]}

MARRA, MT ^{[1
]}

HANNA, WA ^{[1
]}

机构：

[1] MCDONNELL DOUGLAS CORP,ST LOUIS,MO 63166

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1985年 / 32卷 / 06期

关键词：

D O I：

10.1109/TNS.1985.4334098

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：4219 / 4224

页数：6

共 13 条

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