PREDICTING SINGLE EVENT UPSETS IN THE EARTHS PROTON BELTS

被引：18

作者：

BENDEL, WL

PETERSEN, EL

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1984年 / 31卷 / 06期

关键词：

D O I：

10.1109/TNS.1984.4333483

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1201 / 1206

页数：6

共 15 条

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[2]

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PETERSEN, EL ;

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[5]

Janni J. F., 1982, Atomic Data and Nuclear Data Tables, V27, P147, DOI 10.1016/0092-640X(82)90004-3

[6]

LANGWORTHY JB, 1981, COMMUNICATION

[7] UPSET PHENOMENA INDUCED BY ENERGETIC PROTONS AND ELECTRONS [J].

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FILZ, RC ;

BRADFORD, JN .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (06) :1516-1522

[8] SINGLE EVENT UPSET (SEU) OF SEMICONDUCTOR-DEVICES - A SUMMARY OF JPL TEST DATA [J].

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IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4520-4525

[9] SOFT ERRORS DUE TO PROTONS IN THE RADIATION BELT [J].

PETERSEN, E .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) :3981-3986

[10] SUGGESTED SINGLE EVENT UPSET FIGURE OF MERIT [J].

PETERSEN, EL ;

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DIEHL, SE .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1983, 30 (06) :4533-4539

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