Structural analysis of cubic GaN through X-ray pole figure generation

被引:35
作者
Balakrishnan, K
Feuillet, G
Ohta, K
Hamaguchi, H
Okumura, H
Yoshida, S
机构
[1] SHIBAURA INST TECHNOL,MINATO KU,TOKYO 108,JAPAN
[2] SCI UNIV TOKYO,NODA,CHIBA 278,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1997年 / 36卷 / 10期
关键词
GaN; X-ray diffraction; pole figure; secondary hexagonal phase;
D O I
10.1143/JJAP.36.6221
中图分类号
O59 [应用物理学];
学科分类号
摘要
Epilayers of cubic GaN have been grown on (001) GaAs substrates by molecular beam epitaxy using an electron cyclotron resonance (ECR) plasma nitrogen source. In order to study the existence of secondary crystallographic phases in the GaN epilayers; X-ray pole figures were generated on the (001) surfaces of the samples. The exact locations of misoriented cubic and secondary hexagonal phases have been identified and their relative intensities were estimated. The X-ray pole figure technique has been proven to be extremely useful for the structural characterization of cubic GaN epilayers.
引用
收藏
页码:6221 / 6225
页数:5
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