Inverse scattering for near-field scanning optical microscopy with broadband illumination

被引：2

作者：

Davis, Brynmor J. ^{[1
]}

Sun, Jin ^{[2
]}

Schotland, John C. ^{[3
]}

Carney, P. Scott ^{[1
,2
]}

机构：

[1] Univ Illinois, Beckman Inst Adv Sci & Technol, Urbana, IL 61801 USA

[2] Univ Illinois, Dept Elect & Comp Engn, Urbana, IL 61801 USA

[3] Univ Penn, Dept Bioengn, Philadelphia, PA 19104 USA

来源：

JOURNAL OF MODERN OPTICS | 2010年 / 57卷 / 09期

关键词：

near-field; tomography; microscopy; spectral; scanning probe; inverse problem; DIELECTRIC CONTRAST; RESOLUTION; TOMOGRAPHY;

D O I：

10.1080/09500341003698655

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The linear inverse problem for near-field optical microscopy is solved for a broadband scanning modality. Pseudo-inverse formulae are derived and illustrated with numerical simulations.

引用

页码：809 / 815

页数：7

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