Reconstruction of the dielectric contrast profile from near-field data

被引：16

作者：

Carminati, R

Greffet, JJ

机构：

[1] Laboratoire d'Energétique Macroscopique et Moléculaire, Combustion, Ecole Centrale Paris, F-92295 Châtenay-Malabry Cedex, Grande Voie des Vignes

来源：

ULTRAMICROSCOPY | 1995年 / 61卷 / 1-4期

关键词：

D O I：

10.1016/0304-3991(95)00138-7

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A perturbative model describing the influence of topography and dielectric contrast on the near field scattered by an inhomogeneous surface is derived. It is shown that the near-field intensity is sensitive to the integral of the dielectric contrast in the vertical direction across the sample. A solution to the inverse problem from a measurement of the near-field intensity along a line at a constant height above the surface is reported.

引用

页码：11 / 16

页数：6

共 15 条

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