Spectroscopic ellipsometry of fullerene embedded Langmuir-Blodgett films with surface plasmon excitation

被引：4

作者：

Bortchagovsky, E

Yurchenko, I

Kazantseva, Z

Humlicek, J

Hora, J

机构：

[1] Natl Acad Sci Ukraine, Inst Semicond Phys, UA-252022 Kiev, Ukraine

[2] Masaryk Univ, Fac Sci, Dept Solid State Phys, CS-61137 Brno, Czech Republic

来源：

THIN SOLID FILMS | 1998年 / 313卷

关键词：

ellipsometry; Langmuir-Blodgett film; fullerene; surface plasmon;

D O I：

10.1016/S0040-6090(97)00997-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This work presents the first results of an ellipsometric investigation of fullerene embedded Langmuir-Blodgett films with surface plasmon excitation. In contrast to standard ellipsometry, the angle Delta obtained in this way has pronounced features observed at the C-60 transitions. (C) 1998 Elsevier Science S.A.

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收藏

页码：795 / 798

页数：4

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