Imaging in situ cleaved MgO(100) with non-contact atomic force microscopy

被引：25

作者：

Ashworth, TV

Pang, CL

Wincott, PL

Vaughan, DJ

Thornton, G ^{[1
]}

机构：

[1] Univ Manchester, Surface Sci Res Ctr, Manchester M13 9PL, Lancs, England

[2] Univ Manchester, Dept Chem, Manchester M13 9PL, Lancs, England

[3] Univ Manchester, Dept Earth Sci, Manchester M13 9PL, Lancs, England

来源：

APPLIED SURFACE SCIENCE | 2003年 / 210卷 / 1-2期

关键词：

non-contact atomic force microscopy (NC-AFM); MgO; ultrahigh vacuum; cleave;

D O I：

10.1016/S0169-4332(02)01469-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Non-contact atomic force microscopy (NC-AFM) has been used to image MgO(1 0 0) cleaved in situ under ultrahigh vacuum. The image quality was found to be dependent on the quality of the cleave, with the best images revealing an atomically flat surface with rectangular depressions one atomic layer deep. Other features observed include a line defect attributable to missing rows of Mg2+ and O-2(-) ions, bright features consistent with adatoms and cleave-induced damage structure. Images of rougher surfaces contained a high concentration of 'up-down' steps. These latter images are similar to tapping mode images of MgO(1 0 0) cleaved in air. (C) 2003 Elsevier Science B.V. All rights reserved.

引用

页码：2 / 5

页数：4

共 25 条

[1] THEORETICAL INTERPRETATION OF ATOMIC-FORCE-MICROSCOPE IMAGES OF GRAPHITE [J].