Engineering the microstructure of thin films for perpendicular recording

In this paper we discuss various microstructural features that control the recording properties of thin films used in perpendicular recording. These microstructure features include crystallographic texture, grain size, grain size distribution, grain to grain magnetic isolation, grain to grain composition variation and in the case of L1(o) materials the grain to grain variation in the degree of atomic order. We discuss recording media comprised of continuous thin films as well as granular thin films. We discuss media composed of either hcp Co alloys or FePt L1(o) alloys. Methods of controlling the microstructural parameters are discussed as is their effects on recording properties. Examples from our recent research will be used to illustrate these microstructural aspects of perpendicular recording media.