Microstructural and crystallographic aspects of thin film recording media

被引：32

作者：

Laughlin, DE ^{[1
]}

Lu, B

Hsu, YN

Zou, J

Lambeth, DN

机构：

[1] Carnegie Mellon Univ, Dept Mat Sci & Engn, Pittsburgh, PA 15213 USA

[2] Carnegie Mellon Univ, Ctr Data Storage Syst, Pittsburgh, PA 15213 USA

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2000年 / 36卷 / 01期

基金：

美国国家科学基金会; 美国安德鲁·梅隆基金会;

关键词：

epitaxy; magnetic recording media; microstructure; stacking faults; texture;

D O I：

10.1109/20.824424

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Various aspects of the structure of thin film longitudinal recording media are presented and discussed. In particular we discuss the role that the various layers of thin film media play in controlling the microstructure and magnetic properties of the magnetic layer. These include the grain size of the films, the texture of the films, the role of the intermediate layer and the role of chemical segregation.

引用

页码：48 / 53

页数：6

共 20 条

[1] LATERAL MAGNETIC INHOMOGENEITIES IN CO-CR LAYERS DETECTED BY FMR [J].

BERNARDS, JPC ;

SCHRAUWEN, CPG ;

VANKESTEREN, HW .

IEEE TRANSACTIONS ON MAGNETICS, 1990, 26 (01) :33-35

[2] INVESTIGATION OF CR SEGREGATION WITHIN RF-SPUTTERED COCR FILMS [J].

CHAPMAN, JN ;

MCFADYEN, IR ;

BERNARDS, JPC .

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1986, 62 (2-3) :359-366

[3] STRUCTURAL CHARACTERISTICS OF BIAS SPUTTERED COCRTA/CR FILMS [J].

DENG, YP ;

LAMBETH, DN ;

LAUGHLIN, DE .

IEEE TRANSACTIONS ON MAGNETICS, 1993, 29 (06) :3676-3678

[4] INTERDIFFUSION AND GRAIN ISOLATION IN CO/CR THIN-FILMS [J].

FENG, YC ;

LAUGHLIN, DE ;

LAMBETH, DN .

IEEE TRANSACTIONS ON MAGNETICS, 1994, 30 (06) :3948-3950

[5] APFIM STUDIES OF COMPOSITIONAL INHOMOGENEITY IN SPUTTERED CO-CR THIN-FILMS [J].

HONO, K ;

MAEDA, Y ;

LI, JL ;

SAKURAI, T .

IEEE TRANSACTIONS ON MAGNETICS, 1993, 29 (06) :3745-3747

[6] The role of Ta and Pt in segregation within Co-Cr-Ta and Co-Cr-Pt thin film magnetic recording media [J].

Kemner, KM ;

Harris, VG ;

Chakarian, V ;

Idzerda, YU ;

Elam, WT ;

Kao, CC ;

Feng, YC ;

Laughlin, DE ;

Woicik, JC .

JOURNAL OF APPLIED PHYSICS, 1996, 79 (08) :5345-5347

[7] POLARIZATION-DEPENDENT EXAFS STUDIES OF CHEMICAL AND STRUCTURAL ANISOTROPY IN SPUTTER-DEPOSITED CO78CR22 FILMS [J].

KEMNER, KM ;

HARRIS, VG ;

ELAM, WT ;

LODDER, CJ .

IEEE TRANSACTIONS ON MAGNETICS, 1994, 30 (06) :4017-4019

[8] EFFECTS OF CR INTERMEDIATE LAYERS ON COCRPT THIN-FILM MEDIA ON NIAL UNDERLAYERS [J].

LEE, LL ;

LAUGHLIN, DE ;

FANG, L ;

LAMBETH, DN .

IEEE TRANSACTIONS ON MAGNETICS, 1995, 31 (06) :2728-2730

[9] CrMn underlayers for CoCrPt thin film media [J].

Lee, LL ;

Laughlin, DE ;

Lambeth, DN .

IEEE TRANSACTIONS ON MAGNETICS, 1998, 34 (04) :1561-1563

[10] NIAL UNDERLAYERS FOR COCRTA MAGNETIC THIN-FILMS [J].

LEE, LL ;

LAUGHLIN, DE ;

LAMBETH, DN .

IEEE TRANSACTIONS ON MAGNETICS, 1994, 30 (06) :3951-3953

← 1 2 →