EFFECTS OF CR INTERMEDIATE LAYERS ON COCRPT THIN-FILM MEDIA ON NIAL UNDERLAYERS

被引:39
作者
LEE, LL
LAUGHLIN, DE
FANG, L
LAMBETH, DN
机构
[1] Data Storage Systems Center, Carnegie Mellon University, Pittsburgh
[2] Quantum Corp., Wlpitas, CA 95035
基金
美国国家科学基金会; 美国安德鲁·梅隆基金会;
关键词
D O I
10.1109/20.490105
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Sputter-deposited NiAl underlayers can induce better in-plane c-axis textures in the overlying CoCrPt films and have a smaller grain size than Cr underlayers, However, it is found that the CoCrPt/NiAl films on glass substrates have lower coercivity values than the CoCrPt/Cr films, A scheme which inserts a Cr intermediate layer, about 2.5nm thick, between the CoCrPt and NiAl layers is found to greatly improve the in-plane magnetic properties of the CoCrPt/NiAl films. The existing (10 (1) over bar 0) texture of the CoCrPt/NiAl films is enhanced by the Cr intermediate layer. Coercivity as high as 4500 Oe can be achieved, This increase is attributed to the change in interface structure.
引用
收藏
页码:2728 / 2730
页数:3
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