Modeling the mechanical behavior of bulk-micromachined silicon accelerometers

被引:109
作者
van Kampen, RP [1 ]
Wolffenbuttel, RF [1 ]
机构
[1] Delft Univ Technol, Dept Elect Engn, Lab Elect Instrumentat, NL-2628 CD Delft, Netherlands
关键词
accelerometers; bulk micromachining; silicon;
D O I
10.1016/S0924-4247(98)80007-1
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this paper a thorough analysis of the static and dynamic behavior of bulk-micromachined silicon accelerometers is given. Analytical techniques are used and it will be shown that these provide insight into trends and give results within 1% of numerical simulations performed in ANSYS. Discussed issues include the static modeling (sensitivity, cross-axis sensitivity) of the two most commonly used structures, i.e., cantilever-supported and multiple-supported structures, and also the dynamic behavior of these devices, such as resonance and damping. (C) 1998 Elsevier Science S.A.
引用
收藏
页码:137 / 150
页数:14
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