Gate insulators in organic field-effect transistors

被引:807
作者
Veres, J
Ogier, S
Lloyd, G
de Leeuw, D
机构
[1] AVECIA, Elect Mat, Manchester M9 8ZS, Lancs, England
[2] Philips Res Labs, NL-5656 AA Eindhoven, Netherlands
关键词
D O I
10.1021/cm049598q
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In this paper, we review recent progress in the understanding of insulator/semiconductor interfaces in organic field-effect transistors (OFETs). We would like to emphasize that the choice of gate insulator is as important for high-quality OFET devices as the semiconductor itself, especially because of the unique transport mechanisms operating in them. To date researchers have explored numerous organic and inorganic insulator materials, some of them designed to improve the morphology of the organic semiconductor (OSC). Surface treatments, particularly on inorganic insulators, have been shown to influence significantly molecular ordering and device performance. In addition, the deposition technique used for the insulator and semiconductor layers has a further impact on the active interface. Dielectric related effects are reviewed here for a variety of polymeric and molecular semiconductors reported in the literature, with an emphasis on electronic transport. We also review in more detail experiences at Philips and the recent work at Avecia to clarify some of the interface phenomena using amorphous OSC.
引用
收藏
页码:4543 / 4555
页数:13
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