Interference method for determination of the refractive index and thickness

被引：18

作者：

Alexandrov, SA

Chernyh, IV

机构：

[1] RBP Optoelect Res Prod Assoc, Minsk 220012, BELARUS

[2] JSC Peleng, Minsk 220023, BELARUS

来源：

OPTICAL ENGINEERING | 2000年 / 39卷 / 09期

关键词：

refractive index; thickness; interferometry; optical measurements; optical materials; plane parallel plates;

D O I：

10.1117/1.1287583

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The interference method for simultaneous measurement of the absolute refractive index and the thickness of plane parallel samples is developed. This method enables us to test solid (including optical glasses, crystals, plastics, and other sheet materials), liquid, and gaseous media over a wide spectral range. The experimental model for the realization of this method, the laser interference refractometer and thicknessmeter (IRT), is manufactured and investigated. The IRT accuracy of the refractive index measurement is not worse than that of the best modern goniometers and the accuracy of the thickness measurement corresponds to the interference accuracy. (C) 2000 Society of Photo-Optical Instrumentation Engineers. [S0091-3286(00)01809-2].

引用

页码：2480 / 2486

页数：7

共 25 条

[1] Interference refractometer and thicknessmeter [J].

Alexandrov, SA ;

Chernyh, IV ;

Korban, VN .

OPTICAL INSPECTION AND MICROMEASUREMENTS, 1996, 2782 :778-785

[2] Laser interferometer for determination of refractive index and thickness [J].

Alexandrov, SA ;

Chernyh, IV ;

Lischenko, PT .

OPTICAL MANUFACTURING AND TESTING II, 1997, 3134 :486-491

[3]

ALEXANDROV SA, 1999, Patent No. 000367

[4]

ALEXANDROV SA, 1994, P SOC PHOTO-OPT INS, V2208, P214

[5]

ALEXANDROV SA, 1993, P LAS TECHN 93 SHAT, P10

[6]

ALEXANDROV SA, 1992, P SOC PHOTO-OPT INS, V1756, P221

[7]

ALEXANDROV SA, 1998, Patent No. 2444

[8]

ALEXANDROV SA, 1992, Patent No. 1755125

[9]

ALEXANDROV SA, 1990, Patent No. 1550378

[10] INTERFEROMETRIC MEASUREMENT OF REFRACTIVE-INDEXES [J].

BETZLER, K ;

GRONE, A ;

SCHMIDT, N ;

VOIGT, P .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1988, 59 (04) :652-653

← 1 2 3 →