Erbium-thulium interaction in broadband infrared luminescent silicon-rich silicon oxide

被引:42
作者
Seo, SY
Shin, JH
Bae, BS
Park, N
Penninkhof, JJ
Polman, A
机构
[1] Korea Adv Inst Sci & Technol, Dept Phys, Taejon, South Korea
[2] Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, Taejon, South Korea
[3] Seoul Natl Univ, Opt Commun Syst Lab, Sch EECS, Seoul 151744, South Korea
[4] FOM, Inst Atom & Mol Phys, AMOLF, NL-1098 SJ Amsterdam, Netherlands
关键词
D O I
10.1063/1.1577217
中图分类号
O59 [应用物理学];
学科分类号
摘要
The Er-Tm interaction and its effect on the luminescence from Er-Tm codoped silicon-rich silicon oxide (SRSO) is investigated. Er and Tm ions were implanted into SRSO films, which consist of Si nanocrystals embedded in a SiO2 matrix. A broad luminescence spectrum extending from 1.5 to 2.0 mum was observed under excitation with a single light source due to the simultaneous, nonresonant excitation of both Er3+ and Tm3+ via Si nanocrystals. The absolute Er3+ luminescence intensity, however, is reduced relative to the case without Tm codoping. Comparison of the Er3+ and Tm3+ luminescence intensities, lifetimes, and their pump power dependence suggest that Er-Tm interaction leading to an energy transfer from the Er3+:I-4(13/2) state to the excited Tm3+:H-3(4) state is responsible for the reduction in the Er luminescence intensity. (C) 2003 American Institute of Physics.
引用
收藏
页码:3445 / 3447
页数:3
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