Nanometer-scale characterization of ferroelectric polymer thin films by variable-temperature atomic force microscopy

被引：42

作者：

Fukuma, T ^{[1
]}

Kobayashi, K ^{[1
]}

Horiuchi, T ^{[1
]}

Yamada, H ^{[1
]}

Matsushige, K ^{[1
]}

机构：

[1] Kyoto Univ, Dept Elect Sci & Engn, Kyoto 6068501, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2000年 / 39卷 / 6B期

关键词：

ferroelectric phase transition; P(VDF/TrFE); local poling; AFM;

D O I：

10.1143/JJAP.39.3830

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The morphological changes of ferroelectric polymer thin films during the annealing process were directly imaged by variable-temperature atomic force microscopy (AFM). The growing process of the crystallites underlying the surface amorphous layer was observed as well as the morphological changes using intermittent-contact AFM. We found that line structures appeared in the rod like grains at a temperature corresponding to the Curie point of the bulk copolymer in the cooling process. In addition, local piezoelectric response was mapped in order to investigate the relationship between the structural change and the ferroelectric phase transition. The-local polarization prepared at room temperature disappeared after the Blm was heated above 120 degrees C, which agreed with both the Curie temperature and the temperature of the observed structural change.

引用

页码：3830 / 3833

页数：4

共 22 条

[1] Piezoelectric and pyroelectric properties of ferroelectric Langmuir-Blodgett polymer films [J].