共 30 条
[2]
EMBEDDED-ATOM METHOD - DERIVATION AND APPLICATION TO IMPURITIES, SURFACES, AND OTHER DEFECTS IN METALS
[J].
PHYSICAL REVIEW B,
1984, 29 (12)
:6443-6453
[3]
MESSUNG DES WIDERSTANDES DUNNER ISOLIERENDER SCHICHTEN ZWISCHEN GOLDKONTAKTEN IM BEREICH DES TUNNELEFFEKTES
[J].
ZEITSCHRIFT FUR PHYSIK,
1952, 132 (02)
:231-238
[4]
DUDEK R, 2000, IEEE T CPMT A, V23, P4629
[5]
FOILES SM, 1983, PHYS REV LETT, V50, P1285
[6]
EVALUATION OF CONTACT RESISTANCE FOR ISOTROPIC ELECTRICALLY CONDUCTIVE ADHESIVES
[J].
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING,
1995, 18 (02)
:299-304
[8]
Gilleo K., 1995, Soldering & Surface Mount Technology, P12, DOI 10.1108/eb037885
[9]
Harris P. G., 1995, Soldering & Surface Mount Technology, P19, DOI 10.1108/eb037894
[10]
ELECTRICALLY CONDUCTIVE ADHESIVES - A PROSPECTIVE ALTERNATIVE FOR SMD SOLDERING
[J].
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART B-ADVANCED PACKAGING,
1995, 18 (02)
:292-298