End of life impacts of pervasive computing

被引：22

作者：

Kräuchi, PH ^{[1
]}

Wäger, PA

Eugster, M

Grossmann, G

Hilty, L

机构：

[1] Swiss Fed Labs Mat Testing & Res, CH-9014 St Gallen, Switzerland

[2] Swiss Fed Lab Mat Testing & Res, CH-8600 Dubendorf, Switzerland

[3] Solothurn Northwestern Switzerland, FHSO, Univ Appl Sci, CH-4600 Olten, Switzerland

来源：

IEEE TECHNOLOGY AND SOCIETY MAGAZINE | 2005年 / 24卷 / 01期

关键词：

D O I：

10.1109/MTAS.2005.1407747

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The impacts of smart labels on waste management processes were evaluated by estimating the accumulating quantity of waste smart labels according to market analysis data and waste statistics. Furthermore the material composition of a self-adhesive high-frequency (HF) range radio frequency identification (RFID) technology was determined in a laboratory at the Swiss Federal Laboratories for Materials Testing and Research (EMPA) and the impacts on waste management processes were assessed using descriptive methods. Focus was on item level tracking into the retail sector. Results show that the impacts of smart labels are twofold. One the one hand, smart labels induce new material flows into existing recycling loops and impact waste management processes. On the other hand, potentially valuable materials contained in smart labels would finally be disposed of in municipal solid waste incineration (MSWI) plants and hence be irrecoverably lost.

引用

页码：45 / 53

页数：9

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