High-power UV-light-emitting diode on sapphire

被引:28
作者
Iwaya, M
Takanami, S
Miyazaki, A
Watanabe, Y
Kamiyama, S
Amano, H
Akasaki, I
机构
[1] Meijo Univ, Fac Sci & Technol, Tempaku Ku, Nagoya, Aichi 4688502, Japan
[2] Meijo Univ, High Tech Res Ctr, Tempaku Ku, Nagoya, Aichi 4688502, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2003年 / 42卷 / 2A期
关键词
dislocation density; UV-LED; light extraction efficiency; AlGaN; LT-AlN interlayer;
D O I
10.1143/JJAP.42.400
中图分类号
O59 [应用物理学];
学科分类号
摘要
We demonstrated a UV-light-emitting diode on low-dislocation-density AlGaN. This new UV-light-emitting diode shows a peak wavelength of 363 nm, a full-width at half maximum as narrow as 4.8 nm (similar to45 meV) and an output power of 3.2 mW at 100 mA DC current injection.
引用
收藏
页码:400 / 403
页数:4
相关论文
共 23 条
[21]   Defect structure in selectively grown GaN films with low threading dislocation density [J].
Sakai, A ;
Sunakawa, H ;
Usui, A .
APPLIED PHYSICS LETTERS, 1997, 71 (16) :2259-2261
[22]  
WEBER ZL, 1996, MATER RES SOC S P, V395, P351
[23]  
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