Structure evolution during processing of polycrystalline films

被引:723
作者
Thompson, CV [1 ]
机构
[1] MIT, Dept Mat Sci & Engn, Cambridge, MA 02139 USA
来源
ANNUAL REVIEW OF MATERIALS SCIENCE | 2000年 / 30卷
关键词
thin films; grain growth; texture processing;
D O I
10.1146/annurev.matsci.30.1.159
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Polycrystalline films have wide variety of applications in which their grain structures affect their performance and reliability. Thin film growth techniques and growth conditions affect grain shapes, the distribution of grain sizes, and the distribution of the crystallographic orientations of grains. Variations in these structural properties are affected by the conditions under which grain nucleation, growth, coarsening, coalescence, and thickening occur. General trends in structural evolution in polycystalline films, as a function of processing conditions and materials class, are discussed in terms of these fundamental kinetic processes.
引用
收藏
页码:159 / 190
页数:32
相关论文
共 108 条
[1]   MEASUREMENTS OF THE INTRINSIC STRESS IN THIN METAL-FILMS [J].
ABERMANN, R .
VACUUM, 1990, 41 (4-6) :1279-1282
[2]  
ASSARO RJ, 1972, MET T, V3, P1788
[3]   THEORIES OF NORMAL GRAIN-GROWTH IN PURE SINGLE-PHASE SYSTEMS [J].
ATKINSON, HV .
ACTA METALLURGICA, 1988, 36 (03) :469-491
[4]   MACROSCOPIC MODEL FOR COLUMNAR GROWTH OF AMORPHOUS FILMS BY SPUTTER DEPOSITION [J].
BALES, GS ;
ZANGWILL, A .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (01) :145-149
[5]   Evolution of grain structure in thin film reactions [J].
Barmak, K ;
Rickman, JM ;
Michaelsen, C .
JOURNAL OF ELECTRONIC MATERIALS, 1997, 26 (09) :1009-1020
[6]  
BECK PA, 1949, T AM I MIN MET ENG, V180, P163
[7]   CORRELATIONS FOR DIFFUSION CONSTANTS [J].
BROWN, AM ;
ASHBY, MF .
ACTA METALLURGICA, 1980, 28 (08) :1085-1101
[8]   Computer simulation of strain energy effects vs surface and interface energy effects on grain growth in thin films [J].
Carel, R ;
Thompson, CV ;
Frost, HJ .
ACTA MATERIALIA, 1996, 44 (06) :2479-2494
[9]  
CHAKRAVE.BK, 1967, J PHYS CHEM SOLIDS, V28, P2401, DOI 10.1016/0022-3697(67)90026-1
[10]   ORIENTATION DEPENDENCE OF GRAIN-BOUNDARY CRITICAL CURRENTS IN YBA2CU3O7-DELTA BICRYSTALS [J].
DIMOS, D ;
CHAUDHARI, P ;
MANNHART, J ;
LEGOUES, FK .
PHYSICAL REVIEW LETTERS, 1988, 61 (02) :219-222