Investigation on Performance Decay on Photovoltaic Modules: Snail Trails and Cell Microcracks

被引:58
作者
Dolara, Alberto [1 ]
Leva, Sonia [1 ]
Manzolini, Giampaolo [1 ]
Ogliari, Emanuele [1 ]
机构
[1] Politecn Milan, Dept Energy, I-20133 Milan, Italy
来源
IEEE JOURNAL OF PHOTOVOLTAICS | 2014年 / 4卷 / 05期
关键词
Final yield; microcracks; photovoltaic (PV) modules; PV system reliability; snail trail phenomena; PV MODULES; DEGRADATION;
D O I
10.1109/JPHOTOV.2014.2330495
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
080707 [能源环境工程]; 082001 [油气井工程];
摘要
Over the past few decades, the snail trail phenomenon has been known as a discoloration defect on photovoltaic (PV) modules. More recently, snail trails have also been correlated with cell microcracks in PV modules. Despite a serious concern about effects of this phenomenon on PV module performances, very few publications have dealt with this subject. The main purpose of this study is to compare the performances of polycrystalline silicon PV modules affected by the snail trail phenomenon with the reference module. The comparison was performed focusing on I-V and P-V characteristics, thermography analysis, and energy production. Measurements were carried out at the SolarTech Lab of Politecnico di Milano, Italy. The obtained results show that the snail trails may affect the polycrystalline silicon PV modules performances: Compared with reference PV, the maximum power production at standard conditions is reduced by about 40%. The energy production measured over 30 days was about 25% lower than expected.
引用
收藏
页码:1204 / 1211
页数:8
相关论文
共 18 条
[1]
[Anonymous], 2010, 60891 IEC
[2]
[Anonymous], 2012, 27 EUR PHOT SOL EN C
[3]
[Anonymous], 1999, 61724 IEC
[4]
[Anonymous], 27 EUR PHOT SOL EN C
[5]
Experimental investigation of partial shading scenarios on PV (photovoltaic) modules [J].
Dolara, Alberto ;
Lazaroiu, George Cristian ;
Leva, Sonia ;
Manzolini, Giampaolo .
ENERGY, 2013, 55 :466-475
[6]
Why Do PV Modules Fail? [J].
Ferrara, Claudio ;
Philipp, Daniel .
INTERNATIONAL CONFERENCE ON MATERIALS FOR ADVANCED TECHNOLOGIES 2011, SYMPOSIUM O, 2012, 15 :379-387
[7]
*IEC, 2006, 609041 IEC
[8]
Ines Rutschmann M. D.M., 2012, PHOTON INT, P82
[9]
Kontges M., 2010, Proceedings of the 25th European Photovoltaic Solar Energy Conference and Exhibition and the 5th World Conference on Photovoltaic Energy Conversion, P3745
[10]
Assessing the reliability and degradation of photovoltaic module performance parameters [J].
Meyer, EL ;
van Dyk, EE .
IEEE TRANSACTIONS ON RELIABILITY, 2004, 53 (01) :83-92