Simulation of primary recrystallization from TEM orientation data

被引：24

作者：

Baudin, T

Julliard, F

Paillard, P

Penelle, R

机构：

[1] Univ Paris Sud, Lab Met Struct, F-91405 Orsay, France

[2] ISITEM, Lab Genie Mat, F-44306 Nantes 03, France

来源：

SCRIPTA MATERIALIA | 2000年 / 43卷 / 01期

关键词：

computer simulation; recrystallization; SEM-EBSD; TEM;

D O I：

10.1016/S1359-6462(00)00365-1

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The feasibility and the advantages of a primary recrystallization simulation using experimental data measured by transmission electron microscopy were examined. The results were very approximate due to the arbitrary choice of energy values used for the calculation and the large number of assumptions used to simplify the simulation. However, considering all these disadvantages, it is useful to note that the simulated microstructure is quite similar to several experimental microstructures analyzed after short time annealing, even if this comparison remains very qualitative since the observed regions are not identical.

引用

页码：63 / 68

页数：6

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