InSb1-xNx growth and devices

被引:56
作者
Ashley, T
Burke, TM
Pryce, GJ
Adams, AR
Andreev, A
Murdin, BN
O'Reilly, EP
Pidgeon, CR
机构
[1] Malvern Technol Ctr, QinetiQ Ltd, Malvern WR14 3PS, Worcs, England
[2] Univ Surrey, Dept Phys, Guildford GU2 7XH, Surrey, England
[3] Natl Univ Ireland Univ Coll Cork, Natl Microelect Res Ctr, Cork, Ireland
[4] Heriot Watt Univ, Dept Phys, Edinburgh EH14 4AS, Midlothian, Scotland
关键词
D O I
10.1016/S0038-1101(02)00377-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Indium antimonide (InSb) has the smallest energy gap of any of the binary III-V materials, leading to a cut-off wavelength of 7 pm at 300 K. The addition of small proportions of nitrogen to InSb offers the prospect of extending the response wavelength into the 8-12 mum range, which is important for thermal imaging in that atmospheric transmission window and because it encompasses the absorption lines of several environmentally important gases and can therefore be used for monitoring the gases. We report on the growth, by a combination of molecular beam epitaxy and a nitrogen plasma source, of InSb1-xNx with up to 10% nitrogen. Structural characterisation techniques of TEM, AFM and SIMS have enabled some optimisation of material quality to be demonstrated by biasing the sample during growth. Measurements on light emitting diodes comprising a superlattice of InSb0.945N0.055/InSb show an emission wavelength of 10.5 mum, which is confirmed by free electron laser assessment. Comparison with first principles band-structure calculations indicate that approximately 10%, of the nitrogen is active. Hall effect measurements of I mum thick bulk layers indicate an increasing n-type behaviour, the degeneracy effects of which mean, however, that this is only a lower limit. Crown Copyright (C) 2002 Published by Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:387 / 394
页数:8
相关论文
共 26 条
[1]  
Ashley T, 1995, INST PHYS CONF SER, P345
[2]   GROWTH AND LUMINESCENCE PROPERTIES OF GAPN AND GAP1-XNX [J].
BAILLARGEON, JN ;
PEARAH, PJ ;
CHENG, KY ;
HOFLER, GE ;
HSIEH, KC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1992, 10 (02) :829-831
[3]   An analytic approximation with a wide range of applicability for electron initiated Auger transitions in narrow-gap semiconductors [J].
Beattie, AR ;
White, AM .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (02) :802-813
[4]   Localization and percolation in semiconductor alloys: GaAsN vs GaAsP [J].
Bellaiche, L ;
Wei, SH ;
Zunger, A .
PHYSICAL REVIEW B, 1996, 54 (24) :17568-17576
[5]   Bowing parameter of the band-gap energy of GaNxAs1-x [J].
Bi, WG ;
Tu, CW .
APPLIED PHYSICS LETTERS, 1997, 70 (12) :1608-1610
[6]  
BRICE J, 1987, EMIS DATA REV SERIES, V3
[7]  
Burke TM, 2001, IPAP CONFERENCE SER, V2, P296
[8]  
Bürkle L, 2000, APPL PHYS LETT, V77, P1659, DOI 10.1063/1.1310167
[9]   Auger recombination dynamics of Hg0.795Cd0.205Te in the high excitation regime [J].
Ciesla, CM ;
Murdin, BN ;
Phillips, TJ ;
White, AM ;
Beattie, AR ;
Langerak, CJCM ;
Elliott, CT ;
Pidgeon, CR ;
Sivananthan, S .
APPLIED PHYSICS LETTERS, 1997, 71 (04) :491-493
[10]   Kinetic energy distribution of nitrogen ions in an electron cyclotron resonance plasma [J].
Fan, ZY ;
Newman, N .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1998, 16 (04) :2132-2139