Full wafer scale near zero residual nano-imprinting lithography using UV curable monomer solution

被引:68
作者
Lee, H
Jung, GY
机构
[1] Korea Univ, Div Engn & Mat Sci, Seoul 136701, South Korea
[2] Hewlett Packard Labs, QRSI Grp, Palo Alto, CA USA
关键词
nano-imprint lithography; UV curable resin; residual layer; self-assembled monolayer;
D O I
10.1016/j.mee.2004.08.008
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The nano-imprinting lithography is regarded as one of the most promising technologies for nano-sized pattern fabrication and is being focused as a key technology for the mass production. However, significant progress must be made to improve uniform imprinting over large area, low temperature and low pressure operation and imprinting with minimized residual layer. A unique pressure vessel type imprinting system was used to imprint the patterns as small as 150 nm over whole 4-in. diameter wafer with near zero residual layer. To cover the whole surface of 100 mm diameter Si wafer, an array of 18 mm by 18 mm quartz stamps was used as an imprint stamp. UV curable benzylmethacrylate (C11H12O2) based monomer solution is used as an imprinting resin in this study. Near zero residual nano-imprinting over 100 mm diameter Si wafers was successfully demonstrated with 25 atm of imprinting pressure by using liquid state monomer based UV curable resin. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:42 / 47
页数:6
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