A motionless X-ray reflectometer for air/liquid interfaces based on Naudon's design: example of application

被引：10

作者：

Albouy, PA ^{[1
]}

Valerio, P ^{[1
]}

机构：

[1] Univ Paris 11, Phys Solides Lab, CNRS, URA 02, F-91405 Orsay, France

来源：

SUPRAMOLECULAR SCIENCE | 1997年 / 4卷 / 3-4期

关键词：

Langmuir films; X-ray reflectivity;

D O I：

10.1016/S0968-5677(97)00004-7

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A very simple X-ray reflectometer devoted to the study of Langmuir layers adsorbed at an air/liquid interface is described. It is based on the original Naudon design and is characterized by the absence of any moving parts. The performance and limitations of the experimental arrangement are illustrated with data obtained on an alkyloxy-substituted phthalocyanine monolayer on water. (C) 1997 Elsevier Science Ltd. All rights reserved.

引用

页码：191 / 194

页数：4

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