Guided-wave and leakage characteristics of substrate integrated waveguide

被引：1314

作者：

Xu, F ^{[1
]}

Wu, K ^{[1
]}

机构：

[1] Ecole Polytech, Dept Genie Elect, Montreal, PQ H3C 3A7, Canada

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2005年 / 53卷 / 01期

关键词：

commercial electromagnetic simulator; complex modes; leakage; numerical calibration; substrate integrated waveguide (SIW);

D O I：

10.1109/TMTT.2004.839303

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The substrate integrated waveguide (SIW) technique makes it possible that a complete circuit including planar circuitry, transitions, and rectangular waveguides are fabricated in planar form using a standard printed circuit board or other planar processing techniques. In this paper, guided wave and modes characteristics of such an SIW periodic structure are studied in detail for the first time. A numerical multimode calibration procedure is proposed and developed with a commercial software package on the basis of a full-wave finite-element method for the accurate extraction of complex propagation constants of the SIW structure. Two different lengths of the SIW are numerically simulated under multimode excitation. By means of our proposed technique, the complex propagation constant of each SIW mode can accurately be extracted and the electromagnetic bandstop phenomena of periodic structures are also investigated. Experiments are made to validate our proposed technique. Simple design rules are provided and discussed.

引用

页码：66 / 73

页数：8

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