Differentiating 180° and 90° switching of ferroelectric domains with three-dimensional piezoresponse force microscopy

被引：149

作者：

Roelofs, A ^{[1
]}

Böttger, U

Waser, R

Schlaphof, F

Trogisch, S

Eng, LM

机构：

[1] Rhein Westfal TH Aachen, Inst Werkstoffe Elektrotech, D-52056 Aachen, Germany

[2] Tech Univ Dresden, Inst Angew Photophys, D-01062 Dresden, Germany

来源：

APPLIED PHYSICS LETTERS | 2000年 / 77卷 / 21期

关键词：

D O I：

10.1063/1.1328049

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Three-dimensional (3D) piezoresponse force microscopy is applied in order to differentiate 90 degrees and 180 degrees domain switching in PbTiO3 (PTO) thin films. The 3D domain configuration is recorded both statically, revealing the surface crystallographic orientation of PTO films on the nanometer scale, and dynamically by simultaneously mapping the in-plane and out-of-plane hysteresis loops. We show that exclusively 180 degrees switching occurs, also switching only half of the grain volume. (C) 2000 American Institute of Physics. [S0003-6951(00)04647-7].

引用

页码：3444 / 3446

页数：3

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