Development of differential probes in pulsed eddy current testing for noise suppression

被引：53

作者：

Li Shu ^{[1
]}

Huang Songling ^{[1
]}

Zhao Wei ^{[1
]}

机构：

[1] Tsinghua Univ, Dept Elect Engn, State Key Lab Power Syst, Beijing 100084, Peoples R China

来源：

SENSORS AND ACTUATORS A-PHYSICAL | 2007年 / 135卷 / 02期

基金：

中国国家自然科学基金;

关键词：

differential probe; close magnetic circuit; probe titling; lift-off effect; two-stage subtraction; EMC;

D O I：

10.1016/j.sna.2006.10.013

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Differential probes are developed to suppress noises and improve the sensitivity and robustness of pulsed eddy current (PEC) testing. As the close magnetic circuit is used to concentrate the magnetic field, three-core probe and U-shape probe gain high signal to noise ratio (SNR) with limited excitation current, the latter also reduces the influence caused by probe tilting. Lift-off effect is a great obstacle for practical application of pulsed eddy current testing, so probes developed with two-stage differential design can carry out the effective suppression of the lift-off effect. Verifying experiments are also presented, by which the performance of these differential probes are tested and compared in this paper. (c) 2006 Elsevier B.V. All rights reserved.

引用

页码：675 / 679

页数：5

共 12 条

[1]

Bieber JA, 1998, REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 17A AND 17B, P315

[2]

Burke SK, 1998, REVIEW OF PROGRESS IN QUANTITATIVE NONDESTRUCTIVE EVALUATION, VOLS 17A AND 17B, P307

[3] Crack detection and recognition using an eddy current differential probe [J].

Chady, T ;

Enokizono, M ;

Sikora, R .

IEEE TRANSACTIONS ON MAGNETICS, 1999, 35 (03) :1849-1852

[4] Flaws characterization with pulsed eddy currents NDT [J].

Clauzon, T ;

Thollon, F ;

Nicolas, A .

IEEE TRANSACTIONS ON MAGNETICS, 1999, 35 (03) :1873-1876

[5] Pulsed eddy current technology:: Characterizing material loss with gap and lift-off variations [J].

Giguère, S ;

Lepine, BA ;

Dubois, JMS .

RESEARCH IN NONDESTRUCTIVE EVALUATION, 2001, 13 (03) :119-129

[6] Pulsed eddy current signal analysis: Application to the experimental detection and characterization of deep flaws in highly conductive materials [J].

Lebrun, B ;

Jayet, Y ;

Baboux, JC .

NDT & E INTERNATIONAL, 1997, 30 (03) :163-170

[7]

Qidwai U, 1999, INSIGHT, V41, P700

[8]

ROSE JH, 1994, SPIE, V2160, P164

[9] Time-frequency analysis of pulsed eddy current signals [J].

Safizadeh, MS ;

Lepine, BA ;

Forsyth, DS ;

Fahr, A .

JOURNAL OF NONDESTRUCTIVE EVALUATION, 2001, 20 (02) :73-86

[10]

SXKAR TK, 1985, IEEE T INSTRUM MEAS, V34, P541

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