Current-induced transition in atomic-sized contacts of metallic alloys

被引:29
作者
Heemskerk, JWT
Noat, Y
Bakker, DJ
van Ruitenbeek, JM
Thijsse, BJ
Klaver, P
机构
[1] Leiden Univ, Kamerlingh Onnes Lab, NL-2300 RA Leiden, Netherlands
[2] Univ Paris 07, Phys Solides Grp, F-75251 Paris 05, France
[3] Delft Univ Technol, Mat Sci Lab, NL-2628 AL Delft, Netherlands
来源
PHYSICAL REVIEW B | 2003年 / 67卷 / 11期
关键词
D O I
10.1103/PhysRevB.67.115416
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have measured conductance histograms of atomic point contacts made from the noble-transition-metal alloys CuNi, AgPd, and AuPt for a concentration ratio of 1:1. For all alloys these histograms at low-bias voltage (below 300 mV) resemble those of the noble metals, whereas at high bias (above 300 mV) they resemble those of the transition metals. We interpret this effect as a change in the composition of the point contact with bias voltage. We discuss possible explanations in terms of electromigration and differential diffusion induced by current heating.
引用
收藏
页数:5
相关论文
共 21 条
[1]   Effect of disorder on the conductance of a Cu atomic point contact [J].
Bakker, DJ ;
Noat, Y ;
Yanson, AI ;
van Ruitenbeek, JM .
PHYSICAL REVIEW B, 2002, 65 (23) :2354161-2354165
[2]   Conductance quantization histograms of gold nanowires at 4 K [J].
CostaKramer, JL ;
Garcia, N ;
Olin, H .
PHYSICAL REVIEW B, 1997, 55 (19) :12910-12913
[3]   Microscopic origin of conducting channels in metallic atomic-size contacts [J].
Cuevas, JC ;
Yeyati, AL ;
Martin-Rodero, A .
PHYSICAL REVIEW LETTERS, 1998, 80 (05) :1066-1069
[4]   Quantized conductance in Au-Pd and Au-Ag alloy nanocontacts [J].
Enomoto, A ;
Kurokawa, S ;
Sakai, A .
PHYSICAL REVIEW B, 2002, 65 (12) :1-6
[5]   Quantized conductance in relays [J].
Hansen, K ;
Laegsgaard, E ;
Stensgaard, I ;
Besenbacher, F .
PHYSICAL REVIEW B, 1997, 56 (04) :2208-2220
[6]   Electromigration of vacancies in copper [J].
Hoekstra, J ;
Sutton, AP ;
Todorov, TN ;
Horsfield, AP .
PHYSICAL REVIEW B, 2000, 62 (13) :8568-8571
[7]   ONE-ATOM POINT CONTACTS [J].
KRANS, JM ;
MULLER, CJ ;
YANSON, IK ;
GOVAERT, TCM ;
HESPER, R ;
VANRUITENBEEK, JM .
PHYSICAL REVIEW B, 1993, 48 (19) :14721-14724
[8]   THE SIGNATURE OF CONDUCTANCE QUANTIZATION IN METALLIC POINT CONTACTS [J].
KRANS, JM ;
VANRUITENBEEK, JM ;
FISUN, VV ;
YANSON, IK ;
DEJONGH, LJ .
NATURE, 1995, 375 (6534) :767-769
[9]  
Morishita K, 1996, MATER RES SOC SYMP P, V396, P39
[10]   EXPERIMENTAL-OBSERVATION OF THE TRANSITION FROM WEAK LINK TO TUNNEL JUNCTION [J].
MULLER, CJ ;
VANRUITENBEEK, JM ;
DEJONGH, LJ .
PHYSICA C, 1992, 191 (3-4) :485-504