Effect of O2 addition on the deposition of Pt thin films by metallorganic chemical vapor deposition

被引:26
作者
Lee, JM [1 ]
Hwang, CS
Cho, HJ
Suk, CG
Kim, HJ
机构
[1] Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea
[2] Samsung Elect Co Ltd, Semicond Res & Dev Ctr, Kyungki Do 449900, South Korea
[3] APEX Co Ltd, Cent Res & Dev, Chungcheongbuk Do 363810, South Korea
关键词
D O I
10.1149/1.1838390
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
Platinum thin films were deposited on SiO2/Si substrates at a deposition temperature of 325 degrees C by metallorganic chemical vapor deposition using Pt-hexafluoroacetylacetonate as a precursor. It was found that the addition of the proper amount of O-2 gas was essential to deposit high-quality Pt thin films. Dense Pt thin films with smooth surfaces and high electrical conductivity were deposited above a critical O-2 flow rate of 50 seem. The introduction of O-2 gas made the Pt films partially oxidized, resulting in the reduction of their surface and grain boundary energy. Therefore, wettability of the Pt thin films on SiO2/Si was improved and the grain growth of the films by a postdeposition annealing was suppressed as the addition of O-2 was increased during the deposition.
引用
收藏
页码:1066 / 1069
页数:4
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