Advanced plasma processing combined with trench isolation technology for fabrication and fast prototyping of high aspect ratio MEMS in standard silicon wafers

被引:41
作者
Sarajlic, E
de Boer, MJ
Jansen, HV
Arnal, N
Puech, M
Krijnen, G
Elwenspoek, M
机构
[1] Univ Twente, Mesa Res Inst, Transducers Sci & Technol Grp, NL-7500 AE Enschede, Netherlands
[2] Alcatel Vacuum Technol, Adixen Micro Machining Syst, Annecy, France
关键词
D O I
10.1088/0960-1317/14/9/012
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A bulk micromachining technology for fabrication of micro electro mechanical systems (MEMS) in a standard silicon wafer is presented. A fabrication process, suitable for full integration with on-chip electronics, employs advanced plasma processing to etch, passivate and release micromechanical structures in a single plasma system, and vertical trench isolation to obtain electrical isolation between the released components. Distinct electrical domains can be defined even on movable parts. The sophisticated electrical isolation between high-aspect-ratio single-crystal silicon (SCS) components allows simplification of the fabrication and improvement of the performance of existing devices and design of entirely new MEMS. The presented technology is an attractive platform for both fabrication and rapid prototyping of MEMS. This is due to a short processing time, a large freedom of design, high process flexibility and low-cost of the starting SCS substrate relative to SOI substrates. Several example microstructures demonstrating the capabilities of this technology have been successfully fabricated.
引用
收藏
页码:S70 / S75
页数:6
相关论文
共 11 条
  • [1] A novel high aspect ratio technology for MEMS fabrication using standard silicon wafers
    Bertz, A
    Küchler, M
    Knöfler, R
    Gessner, T
    [J]. SENSORS AND ACTUATORS A-PHYSICAL, 2002, 97-8 : 691 - 701
  • [2] BROSNIHAN TJ, 1998, THESIS U CALIFORNIA
  • [3] BROSNIHAN TJ, 1997, INT C SOL STAT SENS, P637
  • [4] Guidelines for etching silicon MEMS structures using fluorine high-density plasmas at cryogenic temperatures
    de Boer, MJ
    Gardeniers, JGE
    Jansen, HV
    Smulders, E
    Gilde, MJ
    Roelofs, G
    Sasserath, JN
    Elwenspoek, M
    [J]. JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2002, 11 (04) : 385 - 401
  • [5] DEBOER MJ, 1995, INT C SOL STAT SENS, P565
  • [6] DIJKSTRA P, 2003, 14 MICR EUR WORKSH M, P107
  • [7] LISA ZZ, 1992, J MICROMECH MICROENG, V2, P31
  • [8] SCREAM MicroElectroMechanical Systems
    MacDonald, NC
    [J]. MICROELECTRONIC ENGINEERING, 1996, 32 (1-4) : 49 - 73
  • [9] Versatile trench isolation technology for the fabrication of microactuators
    Sarajlic, E
    Berenschot, E
    Krijnen, G
    Elwenspoek, M
    [J]. MICROELECTRONIC ENGINEERING, 2003, 67-8 : 430 - 437
  • [10] SRIDHAR U, 1999, INT C SOL STAT SENS, P258