A mechanical microscope: High-speed atomic force microscopy

被引：242

作者：

Humphris, ADL ^{[1
]}

Miles, MJ ^{[1
]}

Hobbs, JK ^{[1
]}

机构：

[1] Univ Bristol, HH Wills Phys Lab, Bristol BS8 1TL, Avon, England

来源：

APPLIED PHYSICS LETTERS | 2005年 / 86卷 / 03期

基金：

英国工程与自然科学研究理事会;

关键词：

D O I：

10.1063/1.1855407

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

An atomic force microscope capable of obtaining images in less than 20 ms is presented. By utilizing a microresonator as a scan stage, and through the implementation of a passive mechanical feedback loop with a bandwidth of more than 2 MHz, a 1000-fold increase in image acquisition rate relative to a conventional atomic force microscope is obtained. This has allowed images of soft crystalline and molten polymer surfaces to be collected in 14.3 ms, with a tip velocity of 22.4 cm s(-1) while maintaining nanometer resolution. (C) 2005 American Institute of Physics.

引用

页码：1 / 3

页数：3

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