High resolution index of refraction profiling of optical waveguides

被引：6

作者：

Taylor, R ^{[1
]}

Hnatovsky, C ^{[1
]}

机构：

[1] Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON K1A 0R6, Canada

来源：

APPLICATIONS OF PHOTONIC TECHNOLOGY 5: CLOSING THE GAP BETWEEN THEORY, DEVELOPMENT, AND APPLICATION | 2002年 / 4833卷

关键词：

reflection NSOM; index of refraction; index profiling;

D O I：

10.1117/12.473921

中图分类号：

R318 [生物医学工程];

学科分类号：

0831 ;

摘要：

A comparison is made between three high spatial resolution index of refraction profiling techniques: reflection-NSOM, microreflection and AFM plus chemical etching using the very small (1.2 x 2 mum) elliptical core of a polarization maintaining E-fiber from Andrew Corporation as a test waveguide.

引用

页码：811 / 819

页数：9

共 12 条

[1] Reflection scanning near-field optical microscopy (R-SNOM) in constant height mode with a dielectric probe - Image interpretation and resolution for high topographic variations [J].

Barchiesi, D ;

Bergossi, O ;

Pieralli, C ;

Spajer, M .

ULTRAMICROSCOPY, 1998, 71 (1-4) :361-370

[2]

BERGOSSI O, 1994, P SOC PHOTO-OPT INS, V2341, P239, DOI 10.1117/12.195546

[3]

Cramer RM, 1999, J MICROSC-OXFORD, V194, P542, DOI 10.1046/j.1365-2818.1999.00511.x

[4] Field characterization of a D-shaped optical fiber using scanning near-field optical microscopy [J].

Huntington, ST ;

Nugent, KA ;

Roberts, A ;

Mulvaney, P ;

Lo, KM .

JOURNAL OF APPLIED PHYSICS, 1997, 82 (02) :510-513

[5] Atomic force microscopy for the determination of refractive index profiles of optical fibers and waveguides: A quantitative study [J].

Huntington, ST ;

Mulvaney, P ;

Roberts, A ;

Nugent, KA ;

Bazylenko, M .

JOURNAL OF APPLIED PHYSICS, 1997, 82 (06) :2730-2734

[6] REFRACTIVE-INDEX PROFILE OF A GRADED INDEX FIBER - MEASUREMENT BY A REFLECTION METHOD [J].

IKEDA, M ;

TATEDA, M ;

YOSHIKIYO, H .

APPLIED OPTICS, 1975, 14 (04) :814-815

[7] REFRACTIVE-INDEX PROFILE MEASUREMENTS OF DIFFUSED OPTICAL-WAVEGUIDES [J].

MARTIN, WE .

APPLIED OPTICS, 1974, 13 (09) :2112-2116

[8]

Moyer P. J., 1996, NEAR FIELD OPTICS

[9]

TAYLOR RS, 1999, MICROSCOPY ANAL MAY, P15

[10] Near-field scanning optical microscopy in reflection: A study of far-field collection geometry effects [J].

Weston, KD ;

DeAro, JA ;

Buratto, SK .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1996, 67 (08) :2924-2929

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