Optimizing the fabrication of aluminum-coated fiber probes and their application to optical near-field lithography

被引:12
作者
Madsen, S [1 ]
Holme, NCR
Ramanujam, PS
Hvilsted, S
Hvam, JM
Smith, SJ
机构
[1] Danish Microengn AS, DME, DK-2730 Herlev, Denmark
[2] Tech Univ Denmark, Mikroelekt Ctr, DK-2800 Lyngby, Denmark
[3] Riso Natl Lab, DK-4000 Roskilde, Denmark
[4] Natl Renewable Energy Lab, Golden, CO 80401 USA
关键词
fabrication of fiber probes; optical near-field lithography;
D O I
10.1016/S0304-3991(97)00095-8
中图分类号
TH742 [显微镜];
学科分类号
摘要
We report on routine fabrication of fiber probes suitable for metal coating. We have investigated how aperture sizes ranging from 75 to 300 nm can be produced using an appropriate set of pulling parameters in a combined heating/pulling process. The quality of the metal coating has been investigated in terms of roughness and the presence of leaking holes in the coating. We report on how the quality of the coating depends on parameters such as deposition rate and background pressure during evaporation. We have used aluminum-coated fiber probes in lithographical studies of different materials, like side-chain azobenzene polyesters and hydrogen-passivated silicon surfaces displaying linewidths as narrow as 20 nm. (C) 1998 Published by Elsevier Science B.V. All rights reserved.
引用
收藏
页码:65 / 71
页数:7
相关论文
共 19 条
[1]   NEAR-FIELD OPTICS - MICROSCOPY, SPECTROSCOPY, AND SURFACE MODIFICATION BEYOND THE DIFFRACTION LIMIT [J].
BETZIG, E ;
TRAUTMAN, JK .
SCIENCE, 1992, 257 (5067) :189-195
[2]  
BETZIG E, 1992, Patent No. 5272330
[3]   REFLECTION-SCANNING NEAR-FIELD OPTICAL MICROSCOPY AND SPECTROSCOPY OF OPAQUE SAMPLES [J].
BIELEFELDT, H ;
HORSCH, I ;
KRAUSCH, G ;
LUXSTEINER, M ;
MLYNEK, J ;
MARTI, O .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1994, 59 (02) :103-108
[4]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[5]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[6]   EXTERNAL-REFLECTION NEAR-FIELD OPTICAL MICROSCOPE WITH CROSS-POLARIZED DETECTION [J].
BOZHEVOLNYI, SI ;
XIAO, M ;
KELLER, O .
APPLIED OPTICS, 1994, 33 (05) :876-880
[7]   CORRELATION BETWEEN OPTICAL AND TOPOGRAPHICAL IMAGES FROM AN EXTERNAL REFLECTION NEAR-FIELD MICROSCOPE WITH SHEAR FORCE FEEDBACK [J].
BOZHEVOLNYI, SI ;
SMOLYANINOV, II ;
KELLER, O .
APPLIED OPTICS, 1995, 34 (19) :3793-3799
[8]   OPTICAL SPECTROSCOPY OF A GAAS/ALGAAS QUANTUM-WIRE STRUCTURE USING NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].
GROBER, RD ;
HARRIS, TD ;
TRAUTMAN, JK ;
BETZIG, E ;
WEGSCHEIDER, W ;
PFEIFFER, L ;
WEST, K .
APPLIED PHYSICS LETTERS, 1994, 64 (11) :1421-1423
[9]   NEAR-FIELD SPECTROSCOPY OF THE QUANTUM CONSTITUENTS OF A LUMINESCENT SYSTEM [J].
HESS, HF ;
BETZIG, E ;
HARRIS, TD ;
PFEIFFER, LN ;
WEST, KW .
SCIENCE, 1994, 264 (5166) :1740-1745
[10]  
HOLME NCR, 1997, THESIS RISO NATL LAB