Bauschinger effect and anomalous thermomechanical deformation induced by oxygen in passivated thin Cu films on substrates

被引:50
作者
Baker, SP
Keller-Flaig, RM
Shu, JB
机构
[1] Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14850 USA
[2] Max Planck Inst Metallforsch, D-70569 Stuttgart, Germany
基金
美国国家科学基金会;
关键词
thin films; dislocation; interfaces; Bauschinger effect; copper;
D O I
10.1016/S1359-6454(03)00113-7
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Annealed thin metal films on Si substrates often show early yielding behavior, similar to the well-known Bauschinger effect in bulk metals, during thermomechanical cycling. Small amounts of oxygen added to a Cu film dramatically enhance early yielding, and lead to extensive plastic deformation at zero stress and increasing stress with temperature during heating. These anomalous plastic deformation effects were explored using tests in which the stresses in the films were measured during thermal cycles with varying temperature endpoints. Anomalous behavior is attributed to a mechanism whereby reversible plastic strain is enhanced by recovery of misfit dislocation line length, which is apparently prevented by strain hardening in films showing normal thermoelastic behavior. The mechanism can account for a variety of thermomechanical behaviors including stress asymmetry and memory effects in thin films. (C) 2003 Acta Materialia Inc. Published by Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:3019 / 3036
页数:18
相关论文
共 45 条
[1]  
Abel A., 1987, Materials Forum, V10, P11
[2]   BAUSCHINGER EFFECT AND STACKING-FAULT ENERGY [J].
ABEL, A ;
MUIR, H .
PHILOSOPHICAL MAGAZINE, 1973, 27 (03) :585-594
[3]  
Ashby M.F., 1982, DEFORMATION MECH MAP
[4]   A model of oxygen-activity-dependent adsorption (desorption) to metal-oxide interfaces [J].
Backhaus-Ricoult, M .
ACTA MATERIALIA, 2000, 48 (18-19) :4365-4374
[5]   Thermomechanical behavior of different texture components in Cu thin films [J].
Baker, SP ;
Kretschmann, A ;
Arzt, E .
ACTA MATERIALIA, 2001, 49 (12) :2145-2160
[6]   Effect of dislocation core spreading at interfaces on strength of thin-films [J].
Baker, SP ;
Zhang, L ;
Gao, HJ .
JOURNAL OF MATERIALS RESEARCH, 2002, 17 (07) :1808-1813
[7]   Energy storage and recovery in thin metal films on substrates [J].
Baker, SP ;
Keller, RM ;
Arzt, E .
THIN-FILMS - STRESSES AND MECHANICAL PROPERTIES VII, 1998, 505 :605-610
[8]   EFFECT OF STRESS REVERSALS ON THE WORK-HARDENING BEHAVIOR OF POLYCRYSTALLINE COPPER [J].
CHRISTODOULOU, N ;
WOO, OT ;
MACEWEN, SR .
ACTA METALLURGICA, 1986, 34 (08) :1553-1562
[9]   In situ transmission electron microscopy study of dislocations in a polycrystalline Cu thin film constrained by a substrate [J].
Dehm, G ;
Arzt, E .
APPLIED PHYSICS LETTERS, 2000, 77 (08) :1126-1128
[10]   Dislocation dynamics in sub-micron confinement: recent progress in Cu thin film plasticity [J].
Dehm, G ;
Balk, TJ ;
von Blanckenhagen, B ;
Gumbsch, P ;
Arzt, E .
ZEITSCHRIFT FUR METALLKUNDE, 2002, 93 (05) :383-391