Fabrication of micro-sensors integrated with single nanometer magnetic particles: Detection of the reversal of the magnetization.

被引:1
作者
Faini, G
Cornette, A
Cros, V
Lee, SF
Barthelemy, A
Petroff, F
Fert, A
机构
[1] L2M-CNRS, 92225 Bagneux Cedex
[2] UMR 137 Thomson CSF, CNRS, Domaine de Corbeville
关键词
D O I
10.1016/0167-9317(95)00293-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Nanometer magnetic particles in intimate coupling with micro-sensors have been fabricated by a novel process in order to detect the reversal of the magnetization by magnetoresistance measurements. The tailoring of the single particles on the top of the sensors needs the in-situ control of the etch layer sequence during the ion beam etching: we are able to end the etching in layers as thin as 4nm with a precision better than 1nm. Thanks to the good sensitivity of our fabricated set-up, we show the first study of the reversal of the magnetization in nanometer size samples by magnetoresistance measurements.
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收藏
页码:483 / 486
页数:4
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