Photon scanning tunneling microscopy of tailor-made photonic structures

被引：23

作者：

Peeters, C

Flück, E

Otter, AM

Balistreri, MLM

Korterik, JP

Kuipers, L

van Hulst, NF

机构：

[1] Univ Twente, Fac Appl Phys, Appl Opt Grp, NL-7500 AE Enschede, Netherlands

[2] Univ Twente, MESA Res Inst, NL-7500 AE Enschede, Netherlands

来源：

APPLIED PHYSICS LETTERS | 2000年 / 77卷 / 01期

关键词：

D O I：

10.1063/1.126903

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Optical field distributions around individually fabricated subwavelength scatterers mapped with a photon scanning tunneling microscope are presented. The photonic structures are produced from ridge waveguides using focused-ion-beam milling. This flexible technique allows us to make single holes and slits of sizes down to 30 nm. A quantitative analysis of the observed optical pattern due to interference between incoming and reflected light yields insight about subwavelength scatterers in waveguides. We conclude that light scattering into high-loss modes of the waveguide occurs. (C) 2000 American Institute of Physics. [S0003-6951(00)01327-9].

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页码：142 / 144

页数：3

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