Experimental aspects of dissipation force microscopy

被引：101

作者：

Loppacher, C ^{[1
]}

Bennewitz, R ^{[1
]}

Pfeiffer, O ^{[1
]}

Guggisberg, M ^{[1
]}

Bammerlin, M ^{[1
]}

Schär, S ^{[1
]}

Barwich, V ^{[1
]}

Baratoff, A ^{[1
]}

Meyer, E ^{[1
]}

机构：

[1] Univ Basel, Inst Phys, CH-4056 Basel, Switzerland

来源：

PHYSICAL REVIEW B | 2000年 / 62卷 / 20期

关键词：

D O I：

10.1103/PhysRevB.62.13674

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Experimental aspects of measuring dissipation on atomic scale using large-amplitude dynamic force microscopy are discussed. Dissipation versus distance curves reveal that long- and short-range forces contribute to the dissipation. The decay length of short-range contributions is found to be close to that of the tunneling current. The dependence of dissipation on the bias voltage and on the oscillation amplitude is presented. Atomic-scale lateral variations of dissipation are discussed; and the role of the atomic constitution of the tip for quantitative results is pointed out.

引用

收藏

页码：13674 / 13679

页数：6

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