Spectroscopic ellipsometry of electrochemical precipitation and oxidation of nickel hydroxide films

被引：14

作者：

Kong, FP ^{[1
]}

Kostecki, R

McLarnon, F

Muller, RH

机构：

[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Environm Energy Technol Div, Berkeley, CA 94720 USA

[2] Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA

来源：

THIN SOLID FILMS | 1998年 / 313卷

关键词：

spectroscopic ellipsometry; nickel hydroxide; electrochemical precipitation; inhomogeneous films; effective medium approximation;

D O I：

10.1016/S0040-6090(97)00994-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In situ spectroscopic ellipsometry was used to investigate the electrochemical precipitation of nickel hydroxide films. By use of optical models for inhomogeneous films it was found that a specific precipitation current density produced the most compact and homogeneous film structures. The density of nickel hydroxide films was derived to be 1.25-1.50 g/cm(3). The redox behavior of precipitated nickel hydroxide films was studied with an effective-medium optical model. Incomplete conversion to nickel oxyhydroxide and a reduction in film thickness were found during the oxidation cycle. Published by Elsevier Science S.A.

引用

页码：775 / 780

页数：6

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