A technique to measure Poisson's ratio of ultrathin polymeric films using atomic force microscopy

被引：15

作者：

Bhushan, B

Mokashi, PS

Ma, T

机构：

[1] Ohio State Univ, Nanotribol Lab Informat Storage, Columbus, OH 43210 USA

[2] Ohio State Univ, MEM NEMS, Columbus, OH 43210 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2003年 / 74卷 / 02期

关键词：

D O I：

10.1063/1.1531827

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Atomic force microscopy (AFM) has been used to measure Poisson's ratio of ultrathin polymeric films used as substrates in magnetic tapes. A technique has been developed to measure the longitudinal and lateral displacements under uniaxial loading of the films on a microscale. Uniaxial tension is applied by means of a tensile stage. Surface height profiles obtained from the AFM images of unstretched and stretched samples are used to monitor the changes in displacements of the polymer samples in the longitudinal and lateral directions simultaneously. Standard polyethylene terephthalate, tensilized polyethylene terephthalate, and tensilized polyethylene naphthalate films are used to demonstrate the technique. (C) 2003 American Institute of Physics.

引用

页码：1043 / 1047

页数：5

共 5 条

[1]

Bhushan B., 2000, MECH RELIABILITY FLE, DOI [10.1007/978-1-4612-1266-9, DOI 10.1007/978-1-4612-1266-9]

[2] In situ microscopic surface characterization studies of polymeric thin films during tensile deformation using atomic force microscopy [J].